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PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope
780319-01
1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, use...show more -
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FPD Tester Model
27014
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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Configurable Functional Test System
ATS-5000
Maximize the uptime of your most critical electronics with the ATS-5000 Functional Test System from Astronics Test Systems. Deployed globally for more than 20 years, the newest version of this tester provides a configurable, affordable solution that delivers just enough test.
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DC Electronic Load
M9822/M9822B
M9822/M9822B is newly designed circuit adopts rapid AD and DA technology to achieve rapid measurements with high accuracy. And the resolution of 0.1mV/0.1mA can effectively display the minor change of voltage and current, so the instrument has a wider application field and achieves better test results. Meanwhile your operation becomes much more comfortable and easy by equipping the high-light VFD, the simple menu and displayed contents and the operation state indicators on all keys. Otherwise the complete and humanized test functions will greatly improve your productivity.
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Advanced SoC/Analog Test System
3650-EX
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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In-Circuit Test (ICT) Fixtures
At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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Precision Low-Loss Multiplexers
Maury’s line of diplexers (DP-series) and triplexers (TP-series) are designed for applications which require combining/ splitting signals at or around harmonic frequencies (nFo) and are connectorized for design-in and test and measurement applications.DP-series diplexers are designed using low-pass and high-pass filters and pass bias between the low-frequency (or Fo) port and the common (or DUT) port.TP-series triplexers are designed using low-pass, bandpass and high-pass filters and pass bias b...show more -
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Test Platforms
Leverage 20+ Years of Test Industry Experience with Built-In IP for Maximum Reuse
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Digital Receiver XMC
XF07-518
Curtiss-Wright Defense Solutions
The XF07-518 is a rugged quad channel 500MSPS 14-bit digital receiver XMC. The ADC devices are controlled by a user programmable Xilinx FPGA which allows high performance processing such as Digital Down Conversion (DDC), filtering and custom algorithms. The combination of direct high-speed, high-resolution analog I/O port and FPGA processing makes the XF07-518 ideal for demanding applications including radar, imaging and test equipment across commercial and defense market spaces.
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VXI Digital Test Instrument
T940 Series
The T940 Series for the VXIbus provides the basis for a complete state-of-the-art digital solution at the subsystem level. The T940 is the solution for both legacy digital replacement and new test stations to be built for digital test including aircraft/ avionics, weapons systems, spacecraft, semiconductors and medical devices.
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PCI 4-Channel Precision Resistor Card
50-297-102
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PCI Precision Resistor Card 4-Channel
50-297-130
The 50-297 PCI precision resistor provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 range is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Fixture Kit In-Line 6TL35 455x600mm
AH500
Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 3000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
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In-Circuit Test System Repairs
Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
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Package Test Loadboards/DIB
DTS Package Test (DIB) loadboards are designed to specific devices and configured for both hand test and fully automated handler applications. DTS loadboards incorporate any brand of socket or contactor and can be configured for multi-site testing. Designs incorporate all necessary components, connectors, mechanical hardware and stiffeners to provide a complete plug-n-play solution. DTS has a vast database of tester and handler information which allow designs to be started and completed quickly without burdening the customer to supply excessive information. DTS designers are experienced in all device types, including digital, analog, mixed signal and RF devices.
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Tunable Laser Source Module
Keysight's has a wide range of tunable laser sources to fit your needs for various applications. In addition to the proven 81600B tunable laser source family, Keysight recently introduced a new family of tunable laser sources - the 8160xx family. The 8160xx tunable laser sources offer the full wavelength range from 1260 nm to 1650 nm with no wavelength gaps. All 8160xx tunable laser sources are modules for the Keysight 8164B lightwave measurement system mainframe. This provides test instrumentat...show more -
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Semiconductor Testers
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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PXIe-4140, 4-Channel Source Measure Unit
781742-01
The PXIe-4140 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4140 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
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6TL23 Off-Line Seat Operation Base Test Platform
H71002300
The 6TL23 is a bare rack for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 18U (580mm depth). The rack is ideal for sit-down operation, since there’s space for the operator’s legs under the fixture receiver.
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Semiconductor Test Software
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Functional Test
cUTS
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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Current Tester
MIG0624
The MIG0624 current tester is designed to test surge protection devices for low voltage applications (<1000 V). MIG0624 is a current generator delivering a 8/20 µs impulse up to 24kA. The exact waveform delivered is a function of the surge generator and the impedance to which the surge is applied.
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Spectroradiometer
Designed to have a capability of producing any visible spectral distribution, mimicking various light sources in the visible region by feedback control of the radiant power emitted by individual LEDs. This LED test system will be used as a transfer standard for photometric, colorimetric and radiometric applications.
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Functional Test Fixtures
Forwessun’s Functional Test Fixtures are tailored to validate the performance of your electronic assemblies, ensuring each product meets critical quality and functional standards. With customisable designs and precision engineering, these fixtures support a range of testing needs—from checking connectivity and function to confirming performance under real-world conditions. Built to handle rigorous demands, Forwessun's solutions are ideal for industries requiring reliable and repeatable results. ...show more -
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High-Frequency Signal Relays
Panasonic Industrial Devices Sales Company of America
Panasonic offers a variety of Signal Relays that can switch high-frequency signals. These products are ideal for applications including radio frequency switching, test and measurement, communication and more.
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In-Circuit Test System Rentals
Forwessun offers flexible test system rental options to meet short-term or seasonal testing demands. Our rental systems are rigorously tested for reliability and performance, giving you access to high-quality equipment without the need for a full purchase commitment. Customised rental agreements allow you to return the equipment when it’s no longer required, providing an ideal solution for scaling up production or filling in during periods of high demand.
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Calibration Kit
FMCK1000
Designed to withstand daily use in high-traffic environments such as in the testing lab or on the production floor. This cost effective calibration kit provides reliable and accurate instrument tuning for all of your test and measurement requirements. Applications: VNA, Full 2-Port CAL VNA, Thru CAL VNA, Substitution CAL method Test & Measurement Lab Equipment Accessories Engineering Test and Evaluation General Purpose Test and evaluation.
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PCI-6516, 32-Channel, ±30 V, Source Outputs, Bank-Isolated Digital I/O Device
779082-01
The PCI-6516 is an industrial digital output interface, with one bank of channels. The device is ideal for industrial control and manufacturing test applications. The PCI-6516 module is an industrial digital I/O interface, with all channels on an isolated bank. You can wire each input bank in a source or sink configuration. With programmable power-up states, you can configure the initial output states in software, to ensure safe operation when connected to industrial actuators. If a computer or application fault occurs, the PCI-6516 can use digital I/O watchdogs to switch to a configurable safe output state to ensure detection and safe recovery from fault conditions.
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Electronics Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
